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 <rdf:Description>
  <dc:title>Baseline identification and peak decomposition for x-ray
diffractograms</dc:title>
  <dc:subject>CRAN Task View: ChemPhys (http://CRAN.R-project.org/view=ChemPhys)</dc:subject>
  <dc:description>Residual-based baseline identification and peak
decomposition for x-ray diffractograms as introduced in
Davies/Gather/Mergel/Meise/Mildenberger (2008).</dc:description>
  <dc:type>Software</dc:type>
  <dc:creator>T. Mildenberger &lt;thoralf.mildenberger@uni-bayreuth.de&gt;</dc:creator>
  <dc:contributor>P.L. Davies, U. Gather, M. Meise, D.Mergel, T. Mildenberger.
Additional Code by T. Bernholt and T. Hofmeister</dc:contributor>
  <dc:rights>GPL (&gt;= 2)</dc:rights>
  <dc:date>2011-03-11</dc:date>
  <dc:format>application/tgz</dc:format>
  <dc:identifier>http://CRAN.R-project.org/package=diffractometry</dc:identifier>
 </rdf:Description>
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